Endah Rahmawati, Riska Ekawita, Mikrajuddin Abdullah, Khairurrijal
A simple and inexpensive capacitance-voltage (C-V) meter based on C8051F006 SoC has been developed for characterizing electronic components. It can be a tool in laboratory to strengthen concepts delivered in lectures and also make students familiar with the characteristic equation of electronics components. The instrumentation design of C-V meter consist of a voltage source generated by DAC and voltage step source applied to device under test (DUT) and its capacitance, which is measured by C-V meter, are stored into computer via an RS-232 serial communication. The C-V meter calibrated for each part and tested for measuring C-V characteristics of capacitor and diodes. The result of the measurement is a curve characterization of C-V. The curves have been compared to the theory as qualitative.
Physics of Electronic Materials Research Division, Faculty of Mathematics and Natural Sciences, Institut Teknologi Bandung, Bandung 40132, Jalan Ganesa 10, Indonesia; Physics Department, Faculty of Mathematics and Natural Sciences, Universitas Negeri Surabaya, Surabaya 62300, Jl. Ketintang, Indonesia; Physics Department, Faculty of Mathematics and Natural Sciences, Universitas Bengkulu, Bengkulu 38371, Jl. Raya Kandang Limun, Indonesia
