Four point probe method based on LOG112 and C8051F006 SoCs for resistivity measurement

Riska Ekawita; Endah Rahmawati; Mikrajuddin Abdullah; Khairurrijal

doi:10.1109/ICICI-BME.2009.5417218

Four point probe method based on LOG112 and C8051F006 SoCs for resistivity measurement

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Riska Ekawita, Endah Rahmawati, Mikrajuddin Abdullah, Khairurrijal

2009 International Conference on Instrumentation, Communication, Information Technology, and Biomedical Engineering 2009, ICICI-BME 2009 Conference paper Cited by 1

Abstract

A four point probe-based resistivity meter using LOG112 and C8051F006 SoCs has been developed. The resistivity meter was calibrated and examined. Current-voltage characteristic-based resistances of resistors are consistent with those labeled to the resistors. Resistivities of the resistors are independent of the injected current, which agree with theory. The resistivity of TiO2 thin film depends on the injected current due to minority and/or majority carrier injection.

Affiliations

Physics of Electronic Materials Research Division, Faculty of Mathematics and Natural Sciences, Institut Teknologi Bandung, Bandung 40132, Jalan Ganesa 10, Indonesia; Physics Department, Universitas Bengkulu, Bengkulu 38371, Jalan Raya Kandang Limun, Indonesia; Physics Department, Universitas Negeri Surabaya, Surabaya 62300, Jalan Ketintang, Indonesia

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