Electron Diffusion Model Based on I-V Data Fitting as the Calculation Method for DSSC Internal Parameters

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Markus Diantoro, Solehudin, Arif Hidayat, Z.A. Imam Supardi, Setia Budi

2019 IOP Conference Series: Materials Science and Engineering Vol. 515 Issue 1 Conference paper Cited by 10 Quartile

Abstract

Dye-sensitized solar cells (DSSC) made of TiO2 have received considerable attention from many researchers for the last three decades. Rapid theoretical and experimental studies have been conducted to improve the performance of DSSC. To understand the DSSC internal parameters, we need to fine-tune each component and identify the suitable conditions in optimizing the performance of assembled devices. In this work, we analyzed and calculated of several parameters the DSSC photoanode, e.g. Electron diffusion and photon absorption coefficients. The experimental I-V data from solar simulator measurements were fitted base on electron diffusion model using Microcal Origin software. We compared the photon absorption coefficient values from this calculation method with the result of UV-Vis measurement and compared the electron diffusion coefficient values with the result of the SEM image data fitting calculation method. It was apparent that the results of I-V data fitting calculation method were comparable with the results of two other techniques. © Published under licence by IOP Publishing Ltd.

Affiliations

Department of Physics, Mathematics and Natural Sciences Faculty, Universitas Negeri Malang, Jl. Semarang, 65145, Indonesia; Center of Advanced Materials for Renewable Energy (CAMRY), Universitas Negeri Malang, Jl. Semarang, 65145, Indonesia; Department of Physics, Faculty of Mathematics and Sciences, Universitas Negeri Surabaya, Jl. Semarang, 65145, Indonesia; Department of Chemistry, Faculty of Mathematics and Natural Sciences, Universitas Negeri Jakarta, Jl. Rawamangun muka, Jakarta Timur, 13220, Indonesia